تک عنصر نوری تصویربرداری نرم اشعه ایکس و طیف سنجی را ترکیب می کند

Single optical element combines soft X-ray imaging and spectroscopy

An international research team from Germany, Switzerland and Japan has demonstrated in a recent study that a single reflection zone plate (RZP) can perform both soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. The approach could simplify future instruments that need to determine both where structures are located in a material and how their electronic properties vary.